Reducing Particle Background of X-ray Silicon Based Detectors Through Correlation Analysis

The main component of the particle-induced instrumental background is secondary electrons and photons generated by high energy cosmic ray protons (with E>100 MeV) depositing some of their energy as they pass through the detector. The detected secondaries of the unfocused component can mimic X-ray events from celestial sources, and they dominate the particle-induced background level. Understanding and further reducing the instrumental background level of future X-ray silicon based detectors (e.g. Athena WFI) would ensure the primary science goals are satisfied with increased margins on exposure and statistical precision. We will present the spatial and energy distribution of valid and rejected events we find in the XMM-Newton filter-wheel-closed data taken in the Small Window Mode. These results will be used to develop an algorithm to reduce the Athena WFI's background on board in the Science Products Module.